Invention Grant
- Patent Title: Route examining system and method
- Patent Title (中): 路线检查系统和方法
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Application No.: US14527246Application Date: 2014-10-29
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Publication No.: US09481384B2Publication Date: 2016-11-01
- Inventor: Joseph Forrest Noffsinger , Ajith Kuttannair Kumar , Yuri Alexeyevich Plotnikov , Jeffrey Michael Fries , Steven Joseph Ehret
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: GE Global Patent Operation
- Main IPC: B61L3/10
- IPC: B61L3/10 ; B61L23/04

Abstract:
A route examining system includes first and second application devices, a control unit, first and second detection units, and an identification unit. The first and second application devices are disposed onboard a vehicle traveling along a route having conductive tracks. The control unit controls injection of a first examination signal into the conductive tracks via the first application device and injection of a second examination signal into the conductive tracks via the second application device. The first and second detection units monitor electrical characteristics of the route in response to the first and second examination signals being injected into the conductive tracks. The identification unit examines the electrical characteristics of the conductive tracks in order to determine whether a section of the route is potentially damaged based on the electrical characteristics.
Public/Granted literature
- US20150053827A1 ROUTE EXAMINING SYSTEM AND METHOD Public/Granted day:2015-02-26
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