Invention Grant
- Patent Title: Systems and methods for planar temperature measurement
- Patent Title (中): 平面温度测量系统和方法
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Application No.: US14016580Application Date: 2013-09-03
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Publication No.: US09482579B2Publication Date: 2016-11-01
- Inventor: Vivek Venugopal Badami , Daniel Francesco Driscoll , Scott Francis Johnson , Paul Joseph Martin , Nilesh Tralshawala , Guanghua Wang
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Hoffman Warnick LLC
- Agent Ernest G. Cusick
- Main IPC: G01J5/02
- IPC: G01J5/02 ; G01J5/00 ; F01D17/08 ; F01D25/30 ; G01J5/10

Abstract:
Various embodiments include systems and apparatuses adapted for detecting two-dimensional turbomachine exhaust temperature. In some embodiments, a system includes a two-dimensional grid sized to mount within an exhaust path of a gas turbomachine, a radiation detection device for detecting radiation emitted from the two-dimensional grid at a plurality of points on the two-dimensional grid, the radiation detection device being mountable proximate the exhaust path and the two-dimensional grid and at least one computing device connected with the radiation detection device, the at least one computing device configured to generate a planar map of the temperature of the exhaust from the gas turbomachine based upon the intensity of the radiation emitted from two-dimensional grid detected at the plurality of points on the two-dimensional grid.
Public/Granted literature
- US20150063412A1 SYSTEMS AND METHODS FOR PLANAR TEMPERATURE MEASUREMENT Public/Granted day:2015-03-05
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