Invention Grant
- Patent Title: Magnetic field value measuring device and method for measuring magnetic field value
- Patent Title (中): 磁场测量装置及测量磁场值的方法
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Application No.: US14777667Application Date: 2014-03-28
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Publication No.: US09482692B2Publication Date: 2016-11-01
- Inventor: Hitoshi Saito , Satoru Yoshimura , Yukinori Kinoshita , Hikaru Nomura , Ryoichi Nakatani
- Applicant: AKITA UNIVERSITY , OSAKA UNIVERSITY
- Applicant Address: JP Akita-shi, Akita JP Suita-shi, Osaka
- Assignee: AKITA UNIVERSITY,OSAKA UNIVERSITY
- Current Assignee: AKITA UNIVERSITY,OSAKA UNIVERSITY
- Current Assignee Address: JP Akita-shi, Akita JP Suita-shi, Osaka
- Agency: Ladas & Parry LLP
- Priority: JP2013-069762 20130328
- International Application: PCT/JP2014/059276 WO 20140328
- International Announcement: WO2014/157661 WO 20141002
- Main IPC: G01Q60/52
- IPC: G01Q60/52 ; G01Q60/56 ; G01Q60/50 ; G01Q60/54

Abstract:
A magnetic field measuring device including: a vibrational probe unit having a probe that includes one or more material(s) whose intensity of magnetization is proportionate to an external magnetic field, a mechanical vibration source for the probe; a vibration detector detecting a vibration frequency and amplitude of the probe; an alternating-current magnetic field generator applying to the probe an alternating-current magnetic field; a direct-current external magnetic field generator applying a direct-current external magnetic field to the probe; a frequency modulation detector detecting frequency modulation occurring to the mechanical vibration of the probe; a direct-current external magnetic field controller adjusting the intensity of the direct-current external magnetic field applied to the probe; and a direct-current magnetic field determination unit determining a value of the direct-current magnetic field originating from a specimen.
Public/Granted literature
- US20160109478A1 MAGNETIC FIELD VALUE MEASURING DEVICE AND METHOD FOR MEASURING MAGNETIC FIELD VALUE Public/Granted day:2016-04-21
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