A method of repairing an organic light-emitting display apparatus, the organic light-emitting display apparatus including a substrate, an organic light-emitting device formed on the substrate, a thin film transistor (TFT) formed on the substrate, an organic insulating layer formed on the TFT, and a conductive pattern formed on the organic insulating layer, the conductive pattern including a shorted part between two conductive elements in the conductive pattern, the method including: removing the short by using a focused ion beam (FIB).