Invention Grant
- Patent Title: Device quality metrics using unsatisfied parity checks
- Patent Title (中): 使用不满足的奇偶校验检查的设备质量度量
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Application No.: US14101679Application Date: 2013-12-10
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Publication No.: US09489256B2Publication Date: 2016-11-08
- Inventor: AbdelHakim S. Alhussien , Earl T. Cohen , Erich F. Haratsch
- Applicant: Seagate Technology LLC
- Applicant Address: US CA Cupertino
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Cupertino
- Agency: Christopher P. Maiorana, PC
- Main IPC: H03M13/00
- IPC: H03M13/00 ; G06F11/10 ; G11B20/18 ; G06F11/30 ; H03M13/11

Abstract:
An apparatus having a device and a circuit is disclosed. The device is configured to convey a codeword. The circuit is configured to (i) receive the codeword from the device, (ii) generate a syndrome by performing a portion less than all of an iterative decoding procedure on the codeword, (iii) generate a value by counting a number of unsatisfied parity checks in the syndrome and (iv) generate a quality metric of the device according to the value.
Public/Granted literature
- US20150128006A1 DEVICE QUALITY METRICS USING UNSATISFIED PARITY CHECKS Public/Granted day:2015-05-07
Information query
IPC分类: