发明授权
US09496412B2 Semiconductor device, manufacturing method thereof, and display device including the semiconductor device
有权
半导体装置及其制造方法以及包括该半导体装置的显示装置
- 专利标题: Semiconductor device, manufacturing method thereof, and display device including the semiconductor device
- 专利标题(中): 半导体装置及其制造方法以及包括该半导体装置的显示装置
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申请号: US14796403申请日: 2015-07-10
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公开(公告)号: US09496412B2公开(公告)日: 2016-11-15
- 发明人: Junichi Koezuka , Kenichi Okazaki , Daisuke Kurosaki , Yukinori Shima , Yasuharu Hosaka
- 申请人: Semiconductor Energy Laboratory Co., Ltd.
- 申请人地址: JP Atsugi-shi, Kanagawa-ken
- 专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人地址: JP Atsugi-shi, Kanagawa-ken
- 代理机构: Fish & Richardson P.C.
- 优先权: JP2014-144659 20140715; JP2015-010055 20150122
- 主分类号: H01L29/786
- IPC分类号: H01L29/786 ; H01L29/423 ; H01L29/66 ; H01L21/02
摘要:
The transistor includes a gate electrode, a gate insulating film over the gate electrode, an oxide semiconductor film over the gate insulating film, a source electrode and a drain electrode electrically connected to the oxide semiconductor film. The oxide semiconductor film includes a first oxide semiconductor film on the gate electrode side and a second oxide semiconductor film over the first oxide semiconductor film. The first oxide semiconductor film includes a first region in which an atomic proportion of In is larger than that of M (M is Ti, Ga, Sn, Y, Zr, La, Ce, Nd, or Hf). The second oxide semiconductor film includes a second region in which an atomic proportion of In is smaller than that of the first oxide semiconductor film. The second region includes a portion thinner than the first region.
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