Invention Grant
- Patent Title: Apparatus and method for measuring quality of holographic image
- Patent Title (中): 用于测量全息图像质量的装置和方法
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Application No.: US14703988Application Date: 2015-05-05
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Publication No.: US09500470B2Publication Date: 2016-11-22
- Inventor: Soo Hyun Lee , Je Ho Nam , Jin Woong Kim , Kyung Ae Moon , Eun Young Jang
- Applicant: Electronics and Telecommunications Research Institute
- Applicant Address: KR Daejeon
- Assignee: Electronics and Telecommunications Research Institute
- Current Assignee: Electronics and Telecommunications Research Institute
- Current Assignee Address: KR Daejeon
- Agency: William Park & Associates Ltd.
- Priority: KR10-2014-0103922 20140811
- Main IPC: G01B9/021
- IPC: G01B9/021 ; G01B11/02 ; G03H1/22

Abstract:
An apparatus and a method for measuring quality of a holographic image are disclosed. The apparatus for measuring the quality of the holographic image may include an obtaining unit to obtain a hologram, a reconstruction unit to reconstruct a three-dimensional (3D) holographic image by irradiating the hologram with a light source, a measuring unit to measure depth of the reconstructed holographic image, and an analysis unit to analyze depth representation quality of the holographic image base on the measured depth of the holographic image.
Public/Granted literature
- US20160040983A1 APPARATUS AND METHOD FOR MEASURING QUALITY OF HOLOGRAPHIC IMAGE Public/Granted day:2016-02-11
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