Invention Grant
- Patent Title: Ion beam line
- Patent Title (中): 离子束线
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Application No.: US14831225Application Date: 2015-08-20
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Publication No.: US09502213B2Publication Date: 2016-11-22
- Inventor: Sami K. Hahto , Tetsuro Yamamoto
- Applicant: Nissin Ion Equipment Co., Ltd.
- Applicant Address: JP Kyoto
- Assignee: Nissin Ion Equipment Co., Ltd.
- Current Assignee: Nissin Ion Equipment Co., Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Pepper Hamilton LLP
- Agent Thomas J. Engellenner; Reza Mollaaghababa
- Main IPC: H01J37/317
- IPC: H01J37/317 ; H01J37/30

Abstract:
In one aspect, an ion implantation system is disclosed, which comprises a deceleration system configured to receive an ion beam and decelerate the ion beam at a deceleration ratio of at least 2, and an electrostatic bend disposed downstream of the deceleration system for causing a deflection of the ion beam. The electrostatic bend includes three tandem electrode pairs for receiving the decelerated beam, where each electrode pair has an inner and an outer electrode spaced apart to allow passage of the ion beam therethrough. Each of the electrodes of the end electrode pair is held at an electric potential less than an electric potential at which any of the electrodes of the middle electrode pair is held and the electrodes of the first electrode pair are held at a lower electric potential relative to the electrodes of the middle electrode pair.
Public/Granted literature
- US20160005570A1 Ion Beam Line Public/Granted day:2016-01-07
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