Invention Grant
- Patent Title: Inertial sensor pendulum test apparatus
- Patent Title (中): 惯性传感器摆锤试验装置
-
Application No.: US14264358Application Date: 2014-04-29
-
Publication No.: US09513311B2Publication Date: 2016-12-06
- Inventor: Rajashree Baskaran , Neil Goodey
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Alpine Technology Law Group LLC
- Main IPC: G01P21/00
- IPC: G01P21/00 ; G01C17/38 ; G01C25/00

Abstract:
Briefly, in accordance with one or more embodiments, a method to test one or more sensors of a device under test may comprise capturing visual motion data of the device under test disposed on an arm of a pendulum apparatus while the arm of the pendulum apparatus is in motion, capturing data from the one or more sensors while the arm of the pending apparatus is in motion, and comparing the visual motion data with the data from the one or more sensors to determine a relationship between the visual motion data and the data from the one or more sensors.
Public/Granted literature
- US20150309070A1 INERTIAL SENSOR PENDULUM TEST APPARATUS Public/Granted day:2015-10-29
Information query