Provided is an inspection apparatus that includes a rotation disk configured to spin about an axis of rotation. The rotation disk includes a probe bushing configured to securely hold a standard eddy current probe a predetermined distance above a surface to be examined by the probe. The rotation disk is further configured to adjustably hold the standard eddy current probe such that the radial offset of the probe from the axis of rotation is set using a radial positioning set screw that is coupled to the rotation disk via a first slotted arm. The predetermined distance is set using a probe height set screw configured to secure the probe within the probe bushing. An outer stationary housing is coupled to the rotation disk such that the rotation disk rotates within the outer stationary housing.