Invention Grant
- Patent Title: Method for measuring the waveform capture rate of parallel digital storage oscilloscope
- Patent Title (中): 并行数字存储示波器波形捕获率测量方法
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Application No.: US14057544Application Date: 2013-10-18
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Publication No.: US09523717B2Publication Date: 2016-12-20
- Inventor: Hao Zeng , Peng Ye , Kuojun Yang , Guang Yang , Qinchuan Zhang
- Applicant: University of Electronic Science and Technology of China
- Applicant Address: CN Chengdu, Sichuan Province
- Assignee: UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA
- Current Assignee: UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA
- Current Assignee Address: CN Chengdu, Sichuan Province
- Agency: Vedder Price P.C.
- Agent Thomas J. Kowalski; Deborah L. Lu
- Priority: CN201210405981 20121022
- Main IPC: G01R29/00
- IPC: G01R29/00 ; G01R13/02
Abstract:
The present invention provides a method for measuring the waveform capture rate of parallel digital storage oscilloscope. On the basis of double pulse measurement, and in consideration of the asymmetry of acquisition and the refreshing time of parallel DSO, the present invention provides a step amplitude-frequency combined pulse measurement to measure the time for waveform acquisition and mapping Tmap, the number of captured waveforms before LCD refreshing Wacq and the dead time caused by LCD refreshing TDDT, and then calculates the measured average WCR of parallel DSO, according to the measured data, so that the WCR of parallel can be measured.
Public/Granted literature
- US20140188419A1 METHOD FOR MEASURING THE WAVEFORM CAPTURE RATE OF PARALLEL DIGITAL STORAGE OSCILLOSCOPE Public/Granted day:2014-07-03
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