Invention Grant
- Patent Title: Dual power-source communication testing apparatus and communication testing method thereof
- Patent Title (中): 双电源通信测试仪器及其通信测试方法
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Application No.: US13786719Application Date: 2013-03-06
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Publication No.: US09529015B2Publication Date: 2016-12-27
- Inventor: Will Wang
- Applicant: Inventec Appliances (Pudong) Corporation , INVENTEC APPLIANCES CORP. , INVENTEC APPLIANCES (SHANGHAI) CO.,LTD.
- Applicant Address: CN Shanghai TW New Taipei CN Shanghai
- Assignee: INVENTEC APPLIANCES (PUDONG) CORPORATION,INVENTEC APPLIANCES CORP.,INVENTEC APPLIANCES (SHANGHAI) CO., LTD.
- Current Assignee: INVENTEC APPLIANCES (PUDONG) CORPORATION,INVENTEC APPLIANCES CORP.,INVENTEC APPLIANCES (SHANGHAI) CO., LTD.
- Current Assignee Address: CN Shanghai TW New Taipei CN Shanghai
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: CN201210056091 20120306
- Main IPC: G01R1/30
- IPC: G01R1/30 ; G06F1/26

Abstract:
A dual power-source testing apparatus for testing a communication board and communication testing method thereof are disclosed. The communication testing apparatus comprises a main body, a first power supply module, and a second power supply module. The main body has a communication testing area with a first port and a second port for supplying power, wherein the board is to be placed in the communication testing area. The first power supply module is configured to provide first power to the communication board through the communication testing area while performing a charging operation to the second power supply module. The communication testing method is to be performed similarly in a communication testing apparatus using dual power sources. Using the present invention may keep good qualities of communication testing operations being performed to the communication board.
Public/Granted literature
- US20130234751A1 DUAL POWER-SOURCE COMMUNICATION TESTING APPARATUS AND COMMUNICATION TESTING METHOD THEREOF Public/Granted day:2013-09-12
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