Invention Grant
US09536848B2 Bond pad structure for low temperature flip chip bonding 有权
焊盘结构用于低温倒装芯片接合

Bond pad structure for low temperature flip chip bonding
Abstract:
Methods for preparing 3D integrated semiconductor devices and the resulting devices are disclosed. Embodiments include forming a first and a second bond pad on a first and a second semiconductor device, respectively, the first and the second bond pads each having plural metal segments, the metal segments of the first bond pad having a configuration different from a configuration of the metal segments of the second bond pad or having the same configuration as a configuration of the metal segments of the second bond pad but rotated with respect to the second bond pad; and bonding the first and second semiconductor devices together through the first and second bond pads.
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