Invention Grant
- Patent Title: Bond pad structure for low temperature flip chip bonding
- Patent Title (中): 焊盘结构用于低温倒装芯片接合
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Application No.: US14515969Application Date: 2014-10-16
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Publication No.: US09536848B2Publication Date: 2017-01-03
- Inventor: Luke England , Christian Klewer
- Applicant: GLOBALFOUNDRIES Inc.
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES INC.
- Current Assignee: GLOBALFOUNDRIES INC.
- Current Assignee Address: KY Grand Cayman
- Agency: Ditthavong & Steiner, P.C.
- Main IPC: H01L23/00
- IPC: H01L23/00 ; H01L25/00 ; H01L25/065 ; H01L23/522

Abstract:
Methods for preparing 3D integrated semiconductor devices and the resulting devices are disclosed. Embodiments include forming a first and a second bond pad on a first and a second semiconductor device, respectively, the first and the second bond pads each having plural metal segments, the metal segments of the first bond pad having a configuration different from a configuration of the metal segments of the second bond pad or having the same configuration as a configuration of the metal segments of the second bond pad but rotated with respect to the second bond pad; and bonding the first and second semiconductor devices together through the first and second bond pads.
Public/Granted literature
- US20160111386A1 BOND PAD STRUCTURE FOR LOW TEMPERATURE FLIP CHIP BONDING Public/Granted day:2016-04-21
Information query
IPC分类: