发明授权
- 专利标题： Mass spectrometer and mass analyzing method for efficiently ionizing a sample with less carry-over
- 专利标题（中）： 质谱分析方法，用于有效地离子化样品，携带较少
-
申请号： US13562435申请日： 2012-07-31
-
公开(公告)号： US09543135B2公开(公告)日： 2017-01-10
- 发明人: Shun Kumano , Masuyuki Sugiyama , Yuichiro Hashimoto , Hideki Hasegawa , Masuyoshi Yamada , Kazushige Nishimura , Hidetoshi Morokuma
- 申请人： Shun Kumano , Masuyuki Sugiyama , Yuichiro Hashimoto , Hideki Hasegawa , Masuyoshi Yamada , Kazushige Nishimura , Hidetoshi Morokuma
- 申请人地址： JP Tokyo
- 专利权人： HITACHI HIGH-TECHNOLOGIES CORPORATION
- 当前专利权人： HITACHI HIGH-TECHNOLOGIES CORPORATION
- 当前专利权人地址： JP Tokyo
- 代理机构： Baker Botts L.L.P.
- 优先权： JP2011-184266 20110826
- 主分类号： H01J49/00
- IPC分类号： H01J49/00 ; H01J49/04
摘要：
A mass spectrometer for efficiently ionizing a sample with less carry-over. The ratio of the amount of sample gas to that of a whole headspace gas is increased by decreasing the pressure inside of a sample vessel in which the sample is sealed thereby efficiently ionizing the sample.
公开/授权文献
- US20130048851A1 MASS SPECTROMETER AND MASS ANALYZING METHOD 公开/授权日：2013-02-28
信息查询
