Invention Grant
- Patent Title: Semiconductor device
- Patent Title (中): 半导体器件
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Application No.: US14841773Application Date: 2015-09-01
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Publication No.: US09543295B2Publication Date: 2017-01-10
- Inventor: Yoshitaka Yamamoto , Masayuki Sakakura , Tetsuhiro Tanaka , Daisuke Matsubayashi
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Fish & Richardson P.C.
- Priority: JP2014-179836 20140904
- Main IPC: H01L27/07
- IPC: H01L27/07 ; H01L29/786 ; H01L27/06 ; H01L49/02 ; H01L23/522 ; H01L27/115 ; H01L21/8258

Abstract:
A semiconductor device that includes transistors with different threshold voltages is provided. Alternatively, a semiconductor device including a plurality of kinds of circuits and transistors whose electrical characteristics are different between the circuits is provided. The semiconductor device includes a first transistor and a second transistor. The first transistor includes an oxide semiconductor, a conductor, a first insulator, a second insulator, and a third insulator. The conductor has a region where the conductor and the oxide semiconductor overlap with each other. The first insulator is positioned between the conductor and the oxide semiconductor. The second insulator is positioned between the conductor and the first insulator. The third insulator is positioned between the conductor and the second insulator. The second insulator has a negatively charged region.
Public/Granted literature
- US20160071840A1 SEMICONDUCTOR DEVICE Public/Granted day:2016-03-10
Information query
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