Invention Grant
- Patent Title: Motion analysis method and apparatus
- Patent Title (中): 运动分析方法和装置
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Application No.: US14699546Application Date: 2015-04-29
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Publication No.: US09552644B2Publication Date: 2017-01-24
- Inventor: Kyoobin Lee , Eric Hyunsurk Ryu , Jun Haeng Lee , Sang-Gyun Chon
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2014-0159853 20141117
- Main IPC: G06F9/00
- IPC: G06F9/00 ; G06T7/00

Abstract:
A method and apparatus for analyzing a motion based on depth information are provided. The method includes: receiving event signals from a first vision sensor configured to generate at least one event signal by sensing at least a portion of an object in which a motion occurs; receiving a current frame from a second vision sensor configured to time-synchronously capture the object; synchronizing the received event signals and the received current frame; and obtaining depth information of the object based on the synchronized event signals and current frame.
Public/Granted literature
- US20160140731A1 MOTION ANALYSIS METHOD AND APPARATUS Public/Granted day:2016-05-19
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