Invention Grant
US09557263B2 Terahertz material evaluation and characterization via material difference frequency generation 有权
太赫兹材料通过材料差异频率产生评估和表征

Terahertz material evaluation and characterization via material difference frequency generation
Abstract:
Methods, systems and apparatuses are disclosed for interrogating characteristics of a substrate material surface and sub-surface by evaluating Terahertz output signals generated by non-Terahertz, optical source inputs.
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