Invention Grant
US09562996B2 Multilayer stack combinations with interleaved overlapping harmonics for wide visible infrared coverage
有权
具有交叉重叠谐波的多层堆叠组合,用于宽可见红外覆盖
- Patent Title: Multilayer stack combinations with interleaved overlapping harmonics for wide visible infrared coverage
- Patent Title (中): 具有交叉重叠谐波的多层堆叠组合,用于宽可见红外覆盖
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Application No.: US13844664Application Date: 2013-03-15
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Publication No.: US09562996B2Publication Date: 2017-02-07
- Inventor: Edward J. Kivel , Timothy J. Nevitt , Michael F. Weber
- Applicant: 3M Innovative Properties Company
- Applicant Address: US MN Saint Paul
- Assignee: 3M INNOVATIVE PROPERTIES COMPANY
- Current Assignee: 3M INNOVATIVE PROPERTIES COMPANY
- Current Assignee Address: US MN Saint Paul
- Main IPC: G02B5/08
- IPC: G02B5/08 ; G02B5/28 ; G02B5/30 ; G02B27/14

Abstract:
A broadband mirror, polarizer, or other reflector includes separate stacks of microlayers. Microlayers in each stack are arranged into optical repeat units, and the stacks are arranged in series. At a design angle of incidence such as normal incidence, the second stack provides a second 1st order reflection band and a distinct second 2nd order reflection band with a second spectral pass band therebetween. The first stack provides a first 1st order reflection band that fills the second spectral pass band such that a single wide reflection band is formed that includes the first 1st order reflection band, the second 1st order reflection band, and the second 2nd order reflection band. In some cases, the single wide reflection band can include a first 2nd order reflection band of the first stack. In some cases, the first and second stacks may have apodized portions which monotonically deviate from respective baseline portions.
Public/Granted literature
- US20130250405A1 MULTILAYER STACK COMBINATIONS WITH INTERLEAVED OVERLAPPING HARMONICS FOR WIDE VISIBLE-INFRARED COVERAGE Public/Granted day:2013-09-26
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