Invention Grant
- Patent Title: Nonvolatile memory system and related method of operation
- Patent Title (中): 非易失性存储器系统及相关操作方法
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Application No.: US14718907Application Date: 2015-05-21
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Publication No.: US09563503B2Publication Date: 2017-02-07
- Inventor: Dong-Young Seo , Dukyoung Yun
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2014-0030284 20140314
- Main IPC: G11C16/28
- IPC: G11C16/28 ; G06F11/10 ; G11C29/04 ; G11C16/04 ; G11C11/56 ; G11C29/02 ; G06F12/00 ; G11C7/14

Abstract:
A system comprises a nonvolatile memory device comprising a memory cell array comprising a plurality of memory blocks each comprising a plurality of cell strings, each of cell strings comprises the plurality of memory cells stacked in a direction perpendicular to a substrate, a ground selection transistor disposed between the memory cells and the substrate, and a string selection transistor disposed between the memory cells and a bitline, and configured to read stored data from the memory cells using a plurality of read voltages; and a memory controller configured to read the memory cells using a reference voltage to generate on-cell data, and adjust the read voltages of the nonvolatile memory device based on the generated on-cell data.
Public/Granted literature
- US20150262694A1 NONVOLATILE MEMORY SYSTEM AND RELATED METHOD OF OPERATION Public/Granted day:2015-09-17
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