Invention Grant
- Patent Title: X-ray detector and method of manufacturing the same
- Patent Title (中): X射线检测器及其制造方法
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Application No.: US14704529Application Date: 2015-05-05
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Publication No.: US09566035B2Publication Date: 2017-02-14
- Inventor: Changbum Lee , Sunil Kim , Dongwook Lee , Jaechul Park
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Priority: KR10-2014-0138615 20141014
- Main IPC: G01T1/24
- IPC: G01T1/24 ; A61B6/00 ; G01T1/17 ; G01T7/00 ; A61B6/04

Abstract:
A method of manufacturing an X-ray detector includes: applying a mask having an opening on a substrate on which a plurality of charge detection units are positioned; filling the opening with a paste including a photoelectric conversion material that absorbs X-rays to generate charges; and forming a photoconductive layer from the paste by separating the mask from the substrate. A thickness of the paste within the opening is thicker in an area adjacent to at least one edge among edges of the opening than in areas around other edges.
Public/Granted literature
- US20160100812A1 X-RAY DETECTOR AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2016-04-14
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