PELLICLE FOR EXTREME ULTRAVIOLET LITHOGRAPHY AND METHOD OF MANUFACTURING THE SAME

    公开(公告)号:US20200159108A1

    公开(公告)日:2020-05-21

    申请号:US16689221

    申请日:2019-11-20

    IPC分类号: G03F1/64

    摘要: A pellicle for extreme ultraviolet lithography and a method of manufacturing the pellicle for extreme ultraviolet lithography are provided. The pellicle for extreme ultraviolet lithography includes a pellicle layer having a specific (or, alternatively, predetermined) thickness, a frame on an edge area of the pellicle layer and supporting the pellicle layer, and a boron implantation layer located between the pellicle layer and the frame. The boron implantation layer is spaced by a specific (or, alternatively, predetermined) distance inward from an outer periphery of the pellicle layer.