Invention Grant
- Patent Title: Reducing the effect of glass charging in MEMS devices
- Patent Title (中): 降低玻璃充电对MEMS器件的影响
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Application No.: US13936938Application Date: 2013-07-08
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Publication No.: US09568491B2Publication Date: 2017-02-14
- Inventor: Mark W. Weber , Timothy J. Hanson
- Applicant: Honeywell International Inc.
- Applicant Address: US NJ Morris Plains
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NJ Morris Plains
- Agency: Fogg and Powers LLC
- Main IPC: G01P15/08
- IPC: G01P15/08 ; B81C1/00

Abstract:
A method of controlling exposed glass charging in a micro-electro-mechanical systems (MEMS) device is disclosed. The method includes providing a MEMS device comprising a proof mass positioned apart from at least one sense plate and at least one outboard metallization layer, wherein at least one conductive glass layer is coupled to the sense plate and the outboard metallization layer, the conductive glass layer including at least one exposed glass portion near the proof mass; and applying a first voltage to the sense plate and a second voltage to the outboard metallization layer. The first voltage is separated from the second voltage by a predetermined voltage level such that the exposed glass portion has an average voltage corresponding to a voltage midway between the first voltage and the second voltage.
Public/Granted literature
- US20150007656A1 REDUCING THE EFFECT OF GLASS CHARGING IN MEMS DEVICES Public/Granted day:2015-01-08
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