Invention Grant
US09572261B2 Conductive through-polymer vias for capacitative structures integrated with packaged semiconductor chips
有权
用于与封装的半导体芯片集成的电容结构的导电聚合物通孔
- Patent Title: Conductive through-polymer vias for capacitative structures integrated with packaged semiconductor chips
- Patent Title (中): 用于与封装的半导体芯片集成的电容结构的导电聚合物通孔
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Application No.: US14668085Application Date: 2015-03-25
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Publication No.: US09572261B2Publication Date: 2017-02-14
- Inventor: Matthew D. Romig , Frank Stepniak , Saumya Gandhi
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Charles A. Brill; Frank D. Cimino
- Main IPC: H05K1/18
- IPC: H05K1/18

Abstract:
An electronic system comprising an electronic body (301) with terminal pads (310) and at least one capacitor embedded in the electronic body. The capacitor including an insulating and adhesive first polymeric film (302) covering the body surface except the terminal pads; a sheet (320) of high-density capacitive elements, the first capacitor terminal being a metal foil (321) attached to film (302), the second terminal a conductive polymeric compound (324), and the insulator a dielectric skin (323). Sheet (320) has sets of via holes: the first set holes reaching metal foil 321), the second set holes reaching the terminals (310), and the third set holes reaching the conductive polymeric compound (324). An insulating second polymeric film (303) lining the sidewalls of the holes and planarizing the sheet surface; and metal (432) filling the via holes between the polymeric sidewalls and forming conductive traces and attachment pads on the system surface.
Public/Granted literature
- US20160286654A1 Conductive Through-Polymer Vias for Capacitative Structures Integrated with Packaged Semiconductor Chips Public/Granted day:2016-09-29
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