Invention Grant
US09574292B2 Method of dynamically changing stitch density for optimal quilter throughput
有权
动态改变缝合密度的方法,以获得最佳的卷曲产量
- Patent Title: Method of dynamically changing stitch density for optimal quilter throughput
- Patent Title (中): 动态改变缝合密度的方法,以获得最佳的卷曲产量
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Application No.: US14665425Application Date: 2015-03-23
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Publication No.: US09574292B2Publication Date: 2017-02-21
- Inventor: Joshua A. Carrier , John Tony Garrett , Jefferson W. Myers , Terrance L. Myers , Jason B. Turner
- Applicant: L & P Property Management Company
- Applicant Address: US CA South Gate
- Assignee: L&P Property Management Company
- Current Assignee: L&P Property Management Company
- Current Assignee Address: US CA South Gate
- Agency: Shook, Hardy & Bacon L.L.P.
- Main IPC: D05B11/00
- IPC: D05B11/00 ; D05B19/12

Abstract:
A method of dynamically changing stitch density of a quilting pattern during sewing is provided. Embodiments of the invention include dynamically changing stitch density along an axis of a sewing pattern based on identifying sewing pattern elements, which may include line segments and arc segments. Each of the line segments and/or arc segments is assigned a dynamically adjusted stitch density based on analysis of each pattern element and/or adjacent element. An adjusted stitch density is assigned to portions of pattern elements that satisfy a threshold measurement for sewing with an adjusted stitch density. In embodiments, a standard stitch density, intermediate stitch density, or an altered stitch density is automatically assigned to each portion of a sewing pattern based on an analysis of threshold length of an element, a threshold angle of a portion of the element with respect to the axis, and/or the stitch density assigned to an adjacent element.
Public/Granted literature
- US20150267330A1 METHOD OF DYNAMICALLY CHANGING STITCH DENSITY FOR OPTIMAL QUILTER THROUGHPUT Public/Granted day:2015-09-24
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