Invention Grant
- Patent Title: Method to determine skin-layer thickness in high pressure die castings
- Patent Title (中): 确定高压压铸件中皮层厚度的方法
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Application No.: US14253119Application Date: 2014-04-15
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Publication No.: US09576352B2Publication Date: 2017-02-21
- Inventor: Qigui Wang , Wenying Yang , James W. Knight
- Applicant: GM Global Technology Operations LLC
- Applicant Address: US MI Detroit
- Assignee: GM Global Technology Operations, LLC
- Current Assignee: GM Global Technology Operations, LLC
- Current Assignee Address: US MI Detroit
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G01N21/88

Abstract:
A quantitative metallographic method to measure skin layer thickness in high pressure die cast aluminum components. Because the faster-cooling skin layer region exhibits a higher volume fraction of eutectic phases than that of a slower-cooling inner region, measurements showing such higher eutectic phases can be used to quantify such layer thickness. An image at various thicknesses of a location of interest in a cast component sample is first obtained using an image analyzer, from which eutectic volume fractions within each of the received images may be determined. Comparisons of the determined volume fractions can be made against a known or predicted quantity for a particular alloy composition, and then correlated to the skin layer thickness via differences between the received or measured quantities and those of the known standard.
Public/Granted literature
- US20150294448A1 METHOD TO DETERMINE SKIN-LAYER THICKNESS IN HIGH PRESSURE DIE CASTINGS Public/Granted day:2015-10-15
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