Invention Grant
- Patent Title: LEED for SEM
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Application No.: US14888414Application Date: 2014-05-14
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Publication No.: US09576770B2Publication Date: 2017-02-21
- Inventor: Tsumoru Shintake
- Applicant: Okinawa Institute of Science and Technology School Corporation
- Applicant Address: JP Okinawa
- Assignee: OKINAWA INSTITUTE OF SCIENCE AND TECHNOLOGY SCHOOL CORPORATION
- Current Assignee: OKINAWA INSTITUTE OF SCIENCE AND TECHNOLOGY SCHOOL CORPORATION
- Current Assignee Address: JP Okinawa
- Agency: Chen Yoshimura LLP
- International Application: PCT/JP2014/002556 WO 20140514
- International Announcement: WO2014/185074 WO 20141120
- Main IPC: G21K5/04
- IPC: G21K5/04 ; H01J37/244 ; H01J37/295

Abstract:
A low energy electron diffraction (LEED) detection module (100) includes: a first vacuum chamber for receiving diffracted electrons from a specimen (109); a larger second vacuum chamber connected to the first vacuum chamber to receive the diffracted electrons that have been transported through the first vacuum chamber; a two-dimensional electron detector disposed in the second vacuum chamber to detect the diffracted electrons; a potential shield (106) disposed generally along an inner surface of the first vacuum chamber and an inner surface of the second vacuum chamber; a magnetic lens (105) to expand a beam of the diffracted electrons that have been transported through the first vacuum chamber towards the two-dimensional electron detector; and a generally plane-shaped energy filter (103) to repel electrons having an energy lower than the probe beam (203) of electrons that impinges on the specimen (109).
Public/Granted literature
- US20160071690A1 LEED FOR SEM Public/Granted day:2016-03-10
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