Invention Grant
US09576866B2 Array substrate, method for fabricating and testing array substrate, and display device
有权
阵列基板,阵列基板的制造和测试方法以及显示装置
- Patent Title: Array substrate, method for fabricating and testing array substrate, and display device
- Patent Title (中): 阵列基板,阵列基板的制造和测试方法以及显示装置
-
Application No.: US14965300Application Date: 2015-12-10
-
Publication No.: US09576866B2Publication Date: 2017-02-21
- Inventor: Mi Zhang
- Applicant: BOE Technology Group Co., Ltd.
- Applicant Address: CN Beijing
- Assignee: BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee: BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee Address: CN Beijing
- Agency: Frommer Lawrence & Haug LLP
- Priority: CN201210473102 20121120
- Main IPC: H01L23/58
- IPC: H01L23/58 ; H01L21/66 ; H01L27/12 ; H01L51/05 ; H01L29/786 ; H01L29/66

Abstract:
The present invention provides an array substrate, which includes a plurality of pixel units, each pixel unit includes a thin film transistor, a pixel electrode, a common electrode and a passivation layer, the thin film transistor includes an active layer, a gate electrode, a source electrode and a drain electrode, the drain electrode and the pixel electrode are connected, the passivation layer is disposed on the active layer, the source electrode, the drain electrode and the pixel electrode, the common electrode is disposed above the pixel electrode with the passivation layer therebetween, a test electrode is disposed on the active layer and under the passivation layer, the test electrode is electrically insulated from the gate electrode, the source electrode and the drain electrode. Correspondingly, a method for fabricating and a method for testing the array substrate, and a display device including the array substrate are provided.
Public/Granted literature
- US20160093543A1 ARRAY SUBSTRATE, METHOD FOR FABRICATING AND TESTING ARRAY SUBSTRATE, AND DISPLAY DEVICE Public/Granted day:2016-03-31
Information query
IPC分类: