Invention Grant
- Patent Title: Method and device for measuring interference in communication system
- Patent Title (中): 测量通信系统干扰的方法和装置
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Application No.: US14440454Application Date: 2013-11-01
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Publication No.: US09578534B2Publication Date: 2017-02-21
- Inventor: Hyoung-Youl Yu , Youn-Sun Kim , Hyo-Jin Lee , Hyoung-Ju Ji , Ju-Ho Lee , Seung-Hoon Choi
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Jefferson IP Law, LLP
- Priority: KR10-2012-0123768 20121102; KR10-2012-0128061 20121113
- International Application: PCT/KR2013/009856 WO 20131101
- International Announcement: WO2014/069941 WO 20140508
- Main IPC: H04W24/10
- IPC: H04W24/10 ; H04B7/02 ; H04B7/06 ; H04L5/00 ; H04B15/00 ; H04B7/04 ; H04J11/00 ; H04W88/08

Abstract:
A method and a device for measuring interference in a communication system are provided. The method includes measuring interference in a base station of a communication system, in which one or more antenna groups are arranged at different positions in a single cell, includes the steps of determining a reception antenna group which is one of the one or more antenna groups that transmits a signal other than an interference signal to a terminal, determining a reference signal in order to measure the strength of the signal transmitted by the reception antenna group, a step of determining a wireless resource so as to measure the interference in each of the one or more antenna groups, and notifying the terminal with the strength of the signal transmitted by the reception antenna group and information for measuring the interference in each of the one or more antenna groups.
Public/Granted literature
- US20150341814A1 METHOD AND DEVICE FOR MEASURING INTERFERENCE IN COMMUNICATION SYSTEM Public/Granted day:2015-11-26
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