Invention Grant
- Patent Title: Microparticle detection system
- Patent Title (中): 微粒检测系统
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Application No.: US14374247Application Date: 2013-03-08
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Publication No.: US09581069B2Publication Date: 2017-02-28
- Inventor: Masayuki Motomura , Takeshi Sugiyama , Keisuke Tashima , Toshiya Matsuoka , Hitoshi Yokoi
- Applicant: NGK SPARK PLUG CO., LTD.
- Applicant Address: JP Aichi
- Assignee: NGK SPARK PLUG CO., LTD.
- Current Assignee: NGK SPARK PLUG CO., LTD.
- Current Assignee Address: JP Aichi
- Agency: Sughrue Mion, PLLC
- Priority: JP2012-059112 20120315
- International Application: PCT/JP2013/001509 WO 20130308
- International Announcement: WO2013/136745 WO 20130919
- Main IPC: G01N15/06
- IPC: G01N15/06 ; F01N11/00 ; G01M15/10 ; G01N27/68 ; G01N15/00 ; G01R31/02

Abstract:
A particulate detection system (1) for detecting the amount of particulates S in a gas under measurement EG includes a detection section (10), a drive circuit (210, 240), and a drive control section (225). The detection section includes a first potential member (31, 12, 13) maintained at a first potential PV1, a second potential member (14, 51, 53) maintained at a second potential PVE, PV3, and an insulating member (121, 77, 76) disposed between the first and second potential members. The system includes insulation test means (215, S3, 245, S5) for testing the degree of insulation between the first and second potential members. The drive control section includes drive permission/prohibition determination means S4, S6 for determining, on the basis of the degree of insulation tested by the insulation test means, whether to permit the drive of the detection section by the drive circuit.
Public/Granted literature
- US20140352405A1 MICROPARTICLE DETECTION SYSTEM Public/Granted day:2014-12-04
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