Invention Grant
US09583321B2 Method for mass spectrometer with enhanced sensitivity to product ions
有权
对产品离子具有增强敏感性的质谱仪的方法
- Patent Title: Method for mass spectrometer with enhanced sensitivity to product ions
- Patent Title (中): 对产品离子具有增强敏感性的质谱仪的方法
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Application No.: US14138589Application Date: 2013-12-23
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Publication No.: US09583321B2Publication Date: 2017-02-28
- Inventor: Oleg Silivra , Harald Oser , Terry N. Olney
- Applicant: Thermo Finnigan LLC
- Applicant Address: US CA San Jose
- Assignee: Thermo Finnigan LLC
- Current Assignee: Thermo Finnigan LLC
- Current Assignee Address: US CA San Jose
- Agent Thomas F. Cooney
- Main IPC: H01J49/26
- IPC: H01J49/26 ; H01J49/00

Abstract:
A mass spectrometry method comprises: introducing a first portion of a sample of ions including precursor ions comprising a first precursor-ion mass-to-charge (m/z) ratio into a first mass analyzer; transmitting the precursor ions from the first mass analyzer to a reaction or fragmentation cell such that a first population of product ions are continuously accumulated therein over a first accumulation time duration; initiating release of the accumulated first population of product ions from the reaction or fragmentation cell; continuously transmitting the released first population of product ions from the reaction cell to a second mass analyzer; transmitting a portion of the released first population of product ions comprising a first product-ion m/z ratio from the second mass analyzer to a detector; and detecting a varying quantity of the product ions having the first product-ion m/z ratio for a predetermined data-acquisition time period after the initiation of the release.
Public/Granted literature
- US20150179419A1 Method for Mass Spectrometer with Enhanced Sensitivity to Product Ions Public/Granted day:2015-06-25
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