Invention Grant
US09591699B2 Temperature measuring apparatus and microwave oven having the same
有权
温度测量装置和微波炉具有相同的功能
- Patent Title: Temperature measuring apparatus and microwave oven having the same
- Patent Title (中): 温度测量装置和微波炉具有相同的功能
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Application No.: US13761552Application Date: 2013-02-07
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Publication No.: US09591699B2Publication Date: 2017-03-07
- Inventor: Tae Gyoon Noh , Kee Hwan Ka , Jun hoe Choi , Jeong Su Han , Yeon A Hwang , Yong Jong Park
- Applicant: Samsung ELectronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Staas & Halsey LLP
- Priority: KR10-2012-0095278 20120829
- Main IPC: H05B6/64
- IPC: H05B6/64

Abstract:
A microwave oven includes a tray rotatably installed inside a cooking compartment, a temperature measuring apparatus comprising a driving unit configured to generate a rotation force, and a sensing unit configured to measure the temperatures of a plurality of temperature measurement points by having a temperature measurement angle changed by the rotation force of the driving unit; and a control unit configured to control the temperature measuring apparatus to measure the plurality of temperature measurement points provided at the upper side of the tray according to a predetermined temperature measurement pattern that provides a different pattern for successive rotation periods of the tray.
Public/Granted literature
- US20140061190A1 TEMPERATURE MEASURING APPARATUS AND MICROWAVE OVEN HAVING THE SAME Public/Granted day:2014-03-06
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