Invention Grant
- Patent Title: Analyzing apparatus and calibration method
- Patent Title (中): 分析仪器和校准方法
-
Application No.: US14715812Application Date: 2015-05-19
-
Publication No.: US09594037B2Publication Date: 2017-03-14
- Inventor: Yusuke Mizuno , Tomoki Aoyama
- Applicant: HORIBA, LTD.
- Applicant Address: JP Kyoto
- Assignee: Horiba, Ltd.
- Current Assignee: Horiba, Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Brooks Kushman P.C.
- Priority: JP2014-104789 20140520; JP2014-104790 20140521
- Main IPC: G01N23/223
- IPC: G01N23/223 ; G01T7/04 ; G01T7/00 ; G01N1/22 ; G01N15/06

Abstract:
In an analyzing apparatus for analyzing compositions using a fluorescent X-ray in the atmosphere, a calibration to eliminate influences caused by a time-dependent change is performed. The analyzing apparatus includes an emission unit, a detection unit, an environment measurement unit, and a time-dependent change calculation unit. The emission unit emits a primary X-ray. The detection unit detects an intensity of a secondary X-ray passing through the atmosphere. The environment measurement unit measures an environment parameter defining the atmosphere. The time-dependent change calculation unit calculates a time-dependent change of the intensity of the secondary X-ray between a first timing and a second timing, based on a first environment parameter, a first intensity of the secondary X-ray, a second environment parameter, and a second intensity of the secondary X-ray.
Public/Granted literature
- US20150338357A1 ANALYZING APPARATUS AND CALIBRATION METHOD Public/Granted day:2015-11-26
Information query