公开(公告)号：US09594037B2

公开(公告)日：2017-03-14

申请号：US14715812

申请日：2015-05-19

申请人： HORIBA, LTD.

发明人： Yusuke Mizuno ,  Tomoki Aoyama

IPC分类号： G01N23/223 ,  G01T7/04 ,  G01T7/00 ,  G01N1/22 ,  G01N15/06

CPC分类号： G01N23/223 ,  G01N1/2205 ,  G01N15/0625 ,  G01N2223/651 ,  G01T7/005 ,  G01T7/04

摘要： In an analyzing apparatus for analyzing compositions using a fluorescent X-ray in the atmosphere, a calibration to eliminate influences caused by a time-dependent change is performed. The analyzing apparatus includes an emission unit, a detection unit, an environment measurement unit, and a time-dependent change calculation unit. The emission unit emits a primary X-ray. The detection unit detects an intensity of a secondary X-ray passing through the atmosphere. The environment measurement unit measures an environment parameter defining the atmosphere. The time-dependent change calculation unit calculates a time-dependent change of the intensity of the secondary X-ray between a first timing and a second timing, based on a first environment parameter, a first intensity of the secondary X-ray, a second environment parameter, and a second intensity of the secondary X-ray.

摘要翻译： 在用于分析大气中的荧光X射线成分的分析装置中，进行用于消除由时间依赖性变化引起的影响的校准。 分析装置包括发射单元，检测单元，环境测量单元和时间变化计算单元。 发射单元发射主X射线。 检测单元检测通过大气的次级X射线的强度。 环境测量单元测量定义大气的环境参数。 时间依赖变化计算单元基于第一环境参数，次X射线的第一强度，第二次X射线的第二强度来计算第一定时和第二定时之间的次X射线的强度的时间依赖性变化 环境参数和次要X射线的第二强度。

公开(公告)号：US11940397B2

公开(公告)日：2024-03-26

申请号：US17251298

申请日：2019-06-06

申请人： HORIBA, LTD.

发明人： Tomoki Aoyama

IPC分类号： G01N23/223 ,  G01B9/04

CPC分类号： G01N23/223 ,  G01B9/04 ,  G01N2223/076 ,  G01N2223/1016 ,  G01N2223/32 ,  G01N2223/402 ,  G01N2223/6116

摘要： The radiation detection device includes: a sample holding unit; an optical microscope configured to observe a sample held by the sample holding unit; an irradiation unit that irradiates the sample with radiation; a detection unit that detects radiation generated from the sample; an adjustment unit that adjusts a relationship between a focal position of the optical microscope and a position of the sample such that the optical microscope is focused on one portion of the sample; a change unit that changes a position, on which the optical microscope is to be focused, on the sample; an imaging unit that creates a partial image captured by the optical microscope at the changed position on the sample in a state in which the adjustment unit performs adjustment for focusing; and a sample image creation unit that creates a sample image by combining a plurality of partial images created by the imaging unit.

公开(公告)号：US11131639B2

公开(公告)日：2021-09-28

申请号：US16447497

申请日：2019-06-20

申请人： HORIBA, LTD.

发明人： Yusuke Mizuno ,  Tomoki Aoyama ,  Erika Matsumoto ,  Shunsuke Murata ,  Toshiyuki Michikita

IPC分类号： G01N23/223 ,  G01T7/04

摘要： To more accurately output a signal related to a source of particulate matter floating in the atmosphere, an analyzer is equipped with a mass concentration measuring unit, an element analysis unit, and a source-related signal output unit. The mass concentration measuring unit measures the mass concentration of fine particulate matter (FP) in the atmosphere. The element analysis unit analyzes an element contained in the FP. The source-related signal output unit outputs a signal related to the source of the FP on the basis of the mass concentration measurement result from the mass concentration measuring unit, and the analysis result for the element contained in the FP from the element analysis unit.

公开(公告)号：US11467107B2

公开(公告)日：2022-10-11

申请号：US17287696

申请日：2019-08-27

申请人： HORIBA, LTD.

发明人： Tomoki Aoyama

IPC分类号： G01N23/2252 ,  G01N23/223

摘要： The X-ray analysis apparatus contains an X-ray generation unit. The X-ray generation unit includes a target plate having a target that is irradiated with an electron beam from an electron beam source and generates X-rays, X-ray convergence optics that converges X-rays generated from the target in conjunction with a movement of the target plate, and a driving unit that changes a position of the target plate or the X-ray convergence optics relative to the electron beam source.

公开(公告)号：US11293885B2

公开(公告)日：2022-04-05

申请号：US16676862

申请日：2019-11-07

申请人： HORIBA, LTD.

发明人： Yusuke Mizuno ,  Tomoki Aoyama ,  Erika Matsumoto

IPC分类号： G01N23/223 ,  G01N21/86 ,  G01N15/06 ,  G01N21/3563 ,  G01N23/2206 ,  G01N23/2204

摘要： An analyzing apparatus includes an X-ray measurement device, an optical characteristic measurement device, and a calculation unit. The X-ray measurement device may be configured to measure fluorescent X-rays generated from the measurement object. The optical characteristic measurement device may be configured to obtain optical characteristics other than the fluorescent X-rays of one or more carbon compounds contained in the measurement object. The calculation unit may be configured to calculate information about a quantity of the one or more carbon compounds contained in the measurement object on the basis of the optical characteristics of the carbon compound(s), and correct the information about fluorescent X-rays measured by the X-ray measurement device on the basis of the information about the quantity of the carbon compound(s).

公开(公告)号：US09606249B2

公开(公告)日：2017-03-28

申请号：US14712841

申请日：2015-05-14

申请人： HORIBA, Ltd.

发明人： Yusuke Mizuno ,  Tomoki Aoyama

IPC分类号： G01T7/00 ,  G01N23/223 ,  G01N1/22 ,  G01N15/06

CPC分类号： G01T7/005 ,  G01N1/2205 ,  G01N15/0612 ,  G01N23/223

摘要： Calibration of an analyzing apparatus is performed using appropriate calibration data that reflects actual measurement conditions. The analyzing apparatus includes an emission unit, a collection filter, a calibration base material, a detection unit, and a composition analysis unit. The emission unit emits an exciting X-ray to generate a fluorescent X-ray by exciting particulate matter. The collection filter collects the particulate matter. The calibration base material is provided in a measurement area together with the collection filter when performing the calibration. The detection unit detects X-rays generated from the measurement area. The detection unit detects a calibration X-ray when performing the calibration. The composition analysis unit generates calibration data by using the calibration X-ray when performing the calibration. The composition analysis unit analyzes compositions of the particulate matter based on the calibration data and a measured X-ray detected by the detection unit when analyzing the compositions of the particulate matter.

公开(公告)号：US09116107B2

公开(公告)日：2015-08-25

申请号：US13861921

申请日：2013-04-12

申请人： HORIBA, Ltd.

发明人： Satoru Goto ,  Tomoki Aoyama

IPC分类号： G01N23/223 ,  G21K1/02

CPC分类号： G01N23/223 ,  G01N2223/076 ,  G01N2223/316 ,  G21K1/02

摘要： The X-ray detection apparatus is equipped with an X-ray irradiation unit, an X-ray detector, a movable collimator and a shield for blocking X-rays. The shield blocks X-rays, which are to enter the X-ray detector directly from the X-ray irradiation unit. The shield also blocks fluorescent X-rays and scattered X-rays generated by irradiation of the collimator with X-rays. In such a manner, it is possible to prevent X-rays other than fluorescent X-rays from the sample S from being detected by the X-ray detector. The shield is joined with the collimator, so that the collimator and the shield move as a unit. It is possible to locate the shield even in a downsized X-ray detection apparatus.

摘要翻译： X射线检测装置配备有X射线照射单元，X射线检测器，可移动准直器和用于阻挡X射线的屏蔽。 屏蔽块将X射线从X射线照射单元直接进入X射线探测器。 屏蔽还阻挡荧光X射线和通过X射线照射准直仪产生的散射X射线。 以这种方式，可以防止X射线检测器检测出来自样品S的荧光X射线以外的X射线。 屏蔽与准直器连接，使得准直器和屏蔽件作为一个单元移动。 甚至可以在尺寸小的X射线检测装置中定位屏蔽。