Invention Grant
- Patent Title: Single point offset calibration for inertial sensors
- Patent Title (中): 惯性传感器的单点偏移校准
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Application No.: US13936117Application Date: 2013-07-05
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Publication No.: US09594095B2Publication Date: 2017-03-14
- Inventor: Sanjay Bhandari , Joe Kelly
- Applicant: MCube, Inc.
- Applicant Address: US CA San Jose
- Assignee: mCube Inc.
- Current Assignee: mCube Inc.
- Current Assignee Address: US CA San Jose
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: G01P21/00
- IPC: G01P21/00 ; G01C25/00

Abstract:
A hand-held processor system for processing data from an integrated MEMS (Micro-Electro-Mechanical-Systems) device disposed within a hand-held computer system and methods therefor. The Single Point Offset Correction (SPOC) process computes offset values to calibrate MEMS sensors using a single set of data measurements at an orientation without dynamic perturbation, and without requiring advance knowledge of orientation of the device. Arbitrary output biases, which are known to be dominant on a single axis, can be corrected to ensure consistent performance. The SPOC process provides a simple method to effectively calibrate a MEMS sensor without requiring extensive system resources. This process can be enhanced by additional estimations of sensor offsets using the set of data measurements or by use of rule-based empirical gain factors.
Public/Granted literature
- US20140012531A1 SINGLE POINT OFFSET CALIBRATION FOR INERTIAL SENSORS Public/Granted day:2014-01-09
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