Invention Grant
US09596027B2 Signal deformation measurement on polarization-multiplexed signals 有权
偏振复用信号的信号变形测量

  • Patent Title: Signal deformation measurement on polarization-multiplexed signals
  • Patent Title (中): 偏振复用信号的信号变形测量
  • Application No.: US14268144
    Application Date: 2014-05-02
  • Publication No.: US09596027B2
    Publication Date: 2017-03-14
  • Inventor: Gang HeDaniel GariepyMats Skold
  • Applicant: EXFO Inc.
  • Applicant Address: CA Quebec
  • Assignee: Exfo Inc.
  • Current Assignee: Exfo Inc.
  • Current Assignee Address: CA Quebec
  • Agent Helene Chotard
  • Main IPC: H04B10/079
  • IPC: H04B10/079 H04J14/06
Signal deformation measurement on polarization-multiplexed signals
Abstract:
There is provided a method and an apparatus for determining quality parameters on a polarization-multiplexed optical signal based on an analysis of the power spectral density of the Signal-Under-Test (SUT). The method is predicated upon knowledge of the spectral shape of the signal in the absence of significant noise or spectral deformation. This knowledge is provided by a reference optical spectrum trace. Based on this knowledge and under the assumption that ASE noise level is approximately constant in wavelength over a given spectral range, the spectral deformation of the signal contribution of the SUT may be estimated using a comparison of the spectral variations of the optical spectrum trace of the SUT with that of the reference optical spectrum trace.
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