Invention Grant
- Patent Title: Measuring probe
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Application No.: US14789211Application Date: 2015-07-01
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Publication No.: US09605943B2Publication Date: 2017-03-28
- Inventor: Atsushi Shimaoka , Tomoyuki Miyazaki , Kazuhiko Hidaka
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2015-043036 20150305
- Main IPC: G01B11/00
- IPC: G01B11/00 ; G01B5/012

Abstract:
A measuring probe includes a stylus, an axial motion mechanism, and a rotary motion mechanism. The axial motion mechanism includes a pair of first diaphragm structures that allows a moving member to be displaced, and the rotary motion mechanism includes a second diaphragm structure that allows a rotating member to be displaced. The second diaphragm structure is disposed between the pair of first diaphragm structures in an axial direction. The respective first diaphragm structures are disposed at a symmetric distance with respect to the second diaphragm structure. This can reduce the length in the axial direction and weight thereof and also reduce shape errors and improve measurement accuracy.
Public/Granted literature
- US20160258738A1 MEASURING PROBE Public/Granted day:2016-09-08
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