Invention Grant
- Patent Title: Method for calibration of an encoder scale and a lithographic apparatus
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Application No.: US14430507Application Date: 2013-09-12
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Publication No.: US09606458B2Publication Date: 2017-03-28
- Inventor: Jeroen Dekkers , Andre Bernardus Jeunink , Erik Roelof Loopstra , Engelbertus Antonius Fransiscus Van Der Pasch , Michael Jozef Mathijs Renkens , Carolus Johannes Catharina Schoormans , Peter Hoekstra
- Applicant: ASML Netherlands B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML NETHERLANDS B.V.
- Current Assignee: ASML NETHERLANDS B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- International Application: PCT/EP2013/068930 WO 20130912
- International Announcement: WO2014/053296 WO 20140410
- Main IPC: G03B27/68
- IPC: G03B27/68 ; G03F7/20 ; G01D5/244 ; G01D18/00 ; G01D5/347

Abstract:
A method for calibrating an encoder scale having an array of marks in a first direction, includes moving the encoder scale in the first direction relative to a first encoder-type sensor, a second encoder-type sensor and a third encoder-type sensor, wherein the first encoder-type sensor and the second encoder-type sensor are fixedly spaced in the first direction at a first distance relative to each other, wherein the second encoder-type sensor and the third encoder-type sensor are fixedly spaced in the first direction at a second distance relative to each other.
Public/Granted literature
- US20150241795A1 METHOD FOR CALIBRATION OF AN ENCODER SCALE AND A LITHOGRAPHIC APPARATUS Public/Granted day:2015-08-27
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