Invention Grant
- Patent Title: Electro-static discharge protection for integrated circuits
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Application No.: US14024833Application Date: 2013-09-12
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Publication No.: US09608437B2Publication Date: 2017-03-28
- Inventor: Ahmed Abdel Monem Youssef , Prasad Srinivasa Siva Gudem , Li-Chung Chang , Ehab Ahmed Sobhy Abdel Ghany
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: Qualcomm Incorporated
- Current Assignee: Qualcomm Incorporated
- Current Assignee Address: US CA San Diego
- Agency: Toler Law Group, PC
- Main IPC: H02H9/00
- IPC: H02H9/00 ; H02H9/04 ; H01L27/02 ; H03F1/52 ; H03F1/22

Abstract:
Techniques for improving electro-static discharge (ESD) performance in integrated circuits (IC's). In an aspect, one or more protective diodes are provided between various nodes of the IC. For example, protective diode(s) may be provided between the drain and gate of an amplifier input transistor, and/or between the drain and ground, etc. In certain exemplary embodiments, the amplifier may be a cascode amplifier. Further aspects for effectively dealing with ESD phenomena are described.
Public/Granted literature
- US20150070803A1 ELECTRO-STATIC DISCHARGE PROTECTION FOR INTEGRATED CIRCUITS Public/Granted day:2015-03-12
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