Invention Grant
- Patent Title: Measuring probe
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Application No.: US14789283Application Date: 2015-07-01
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Publication No.: US09618312B2Publication Date: 2017-04-11
- Inventor: Atsushi Shimaoka , Tomoyuki Miyazaki , Kazuhiko Hidaka
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2015-043034 20150305
- Main IPC: G01B3/00
- IPC: G01B3/00 ; G01B5/20 ; G01B5/00 ; G01B5/012

Abstract:
A measuring probe includes a stylus having a contact part to be in contact with an object to be measured, an axial motion mechanism having a moving member that allows the contact part to move in an axial direction, and a rotary motion mechanism having a rotating member that allows the contact part to move along a plane perpendicular to the axial direction by means of rotary motion. The measuring probe includes a probe main body that incorporates the axial motion mechanism, and a probe module that is supported by the probe main body, incorporates the rotary motion mechanism, and supports the stylus. The probe main body and the probe module are detachably coupled to each other with a pair of rollers and a ball capable of positioning to each other. This allows adequate detection sensitivity and a restoring force suitable for the stylus to be obtained at a low cost.
Public/Granted literature
- US20160258733A1 MEASURING PROBE Public/Granted day:2016-09-08
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