Invention Grant
- Patent Title: Oxide film, integrated circuit device, and methods of forming the same
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Application No.: US14972903Application Date: 2015-12-17
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Publication No.: US09627469B2Publication Date: 2017-04-18
- Inventor: Ha-young Yi , Jun-won Lee , Byoung-deog Choi , Jong-myeong Lee , Mun-jun Kim , Hong-gun Kim
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Onello & Mello, LLP
- Priority: KR10-2015-0069350 20150519
- Main IPC: H01L29/40
- IPC: H01L29/40 ; H01L49/02

Abstract:
A doped mold film is formed with a dopant concentration gradient in the doped mold film that continuously varies in a thickness direction and a portion of the doped mold film is etched in the thickness direction to form a hole so that an electrode can be formed along an inner wall of the hole. The electrode thus formed includes a first outer wall surface, a second outer wall surface, and a third outer wall surface wherein the first outer wall surface is in contact with a sidewall of an insulating pattern formed on a substrate within a through hole formed in the insulating pattern; the second outer wall surface is in contact with a top surface of the insulating pattern and extends in a lateral direction; the third outer wall surface is spaced apart from the first outer wall surface with the second outer wall surface therebetween; and the third outer wall surface extends on the insulating pattern in a direction away from the substrate.
Public/Granted literature
- US20160343799A1 OXIDE FILM, INTEGRATED CIRCUIT DEVICE, AND METHODS OF FORMING THE SAME Public/Granted day:2016-11-24
Information query
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