A method for testing an imaging subsystem of a system-on-a-chip (SOC) is provided that includes executing imaging subsystem test software instructions periodically on a processor of the SOC, receiving reference image data in the imaging subsystem responsive to the executing of the test software instructions, performing image signal processing on the reference image data by the imaging subsystem to generate processed reference image data, and using the processed reference image data by the test software instructions to verify whether or not the imaging subsystem is operating correctly.