Invention Grant
- Patent Title: Sheet resistance measuring method
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Application No.: US14470902Application Date: 2014-08-27
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Publication No.: US09632048B2Publication Date: 2017-04-25
- Inventor: Shi Shu , Bing Sun , Bin Zhang , Kexin Lu , Yue Shi , Zhijun Lv
- Applicant: BOE TECHNOLOGY GROUP CO., LTD.
- Applicant Address: CN Beijing
- Assignee: BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee: BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee Address: CN Beijing
- Agency: Blakely Sokoloff Taylor & Zafman LLP
- Priority: CN201410096391 20140314
- Main IPC: G01N27/04
- IPC: G01N27/04 ; G01R27/00

Abstract:
The present disclosure relates to a sheet resistance measuring method, comprising the following steps: connecting at least one to-be-measured thin film having a predetermined shape to two separate electrodes in at least one pair of electrodes; measuring the resistance between the two electrodes in each pair of electrodes; and determining the sheet resistance of the to-be-measured thin film based on the measured resistance and the shape of the corresponding to-be-measured thin film.
Public/Granted literature
- US20150260670A1 SHEET RESISTANCE MEASURING METHOD Public/Granted day:2015-09-17
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