Invention Grant
- Patent Title: Circuits and techniques for detecting an open pin condition of an integrated circuit
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Application No.: US14301487Application Date: 2014-06-11
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Publication No.: US09641070B2Publication Date: 2017-05-02
- Inventor: Joshua Wibben
- Applicant: Allegro Microsystems, LLC
- Applicant Address: US MA Worcester
- Assignee: Allegro Microsystems, LLC
- Current Assignee: Allegro Microsystems, LLC
- Current Assignee Address: US MA Worcester
- Agency: Daly, Crowley, Mofford & Durkee, LLP
- Main IPC: G01R31/02
- IPC: G01R31/02 ; H02M3/156 ; G01R31/28 ; G01R31/40 ; H02M1/32 ; H02M1/00

Abstract:
An integrated circuit an open pin detector includes a current source coupled to the pin, a comparator having a first input coupled to the pin, a second input responsive to a threshold voltage, and an output at which a comparator output signal is provided. A controller is responsive to the comparator output signal to provide an enable signal to the current source and an open pin signal indicative of an open pin condition at the pin. A method for detecting an open pin condition of a pin of an integrated circuit includes comparing the pin voltage to a first threshold voltage level, initiating open pin detection in response to the pin voltage falling below the first threshold voltage level, such as by providing a current to the pin, and indicating an open pin condition if the pin voltage rises to exceed a second threshold voltage level within a predetermined time interval. Also described is preventing the pin voltage from exceeding a predetermined voltage level during open pin detection.
Public/Granted literature
- US20150362550A1 Circuits and Techniques for Detecting an Open Pin Condition of an Integrated Circuit Public/Granted day:2015-12-17
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