Invention Grant
- Patent Title: Method and apparatus for testing a sensor
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Application No.: US14063290Application Date: 2013-10-25
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Publication No.: US09651575B2Publication Date: 2017-05-16
- Inventor: John Hepp
- Applicant: Sercel, Inc.
- Applicant Address: US TX Houston
- Assignee: SERCEL INC.
- Current Assignee: SERCEL INC.
- Current Assignee Address: US TX Houston
- Agency: Patent Portfolio Builders PLLC
- Main IPC: G01P21/00
- IPC: G01P21/00 ; G01V13/00 ; G01H3/00

Abstract:
There is a testing device for testing a sensor. The testing device includes a rotating mechanism; a first rotating plate connected to the rotating mechanism so that the first rotating plate rotates around an orbital axis (Z1); a second plate rotatably attached to the first rotating plate at a rotating point, the second plate having a rotational axis (Z2) offset from the orbital axis (Z1) by a predetermined distance R; and a gripping mechanism attached to the second plate and configured to receive and fix the sensor relative to the second plate. The second plate follows a circular trajectory with constant attitude around the orbital axis (Z1).
Public/Granted literature
- US20150114079A1 METHOD AND APPARATUS FOR TESTING A SENSOR Public/Granted day:2015-04-30
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