- 专利标题: Semiconductor device and method of manufacturing the same
-
申请号: US14984085申请日: 2015-12-30
-
公开(公告)号: US09653400B2公开(公告)日: 2017-05-16
- 发明人: Tae-Jin Yim , Woo-Kyung You , Jong-Min Baek , Sang-Hoon Ahn , Thomas Oszinda , Kee-Young Jun
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR Gyeonggi-do
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Gyeonggi-do
- 代理机构: Harness, Dickey & Pierce, P.L.C.
- 优先权: KR10-2015-0008714 20150119
- 主分类号: H01L23/48
- IPC分类号: H01L23/48 ; H01L23/52 ; H01L29/40 ; H01L23/532 ; H01L21/768 ; H01L23/522
摘要:
A semiconductor device is provided. The semiconductor device includes a first porous interlayer insulating film having a low dielectric constant and including a first region and a second region, a second interlayer insulating film formed on the first interlayer insulating film in the first region, a plurality of first conductive patterns formed in the second interlayer insulating film such that the plurality of first conductive patterns are spaced apart from each other, at least one second conductive pattern formed in the first interlayer insulating film in the second region and air gaps disposed at lateral sides of the plurality of first conductive patterns.
公开/授权文献
信息查询
IPC分类: