Invention Grant
- Patent Title: Diluted drift layer with variable stripe widths for power transistors
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Application No.: US15220910Application Date: 2016-07-27
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Publication No.: US09653577B2Publication Date: 2017-05-16
- Inventor: Yongxi Zhang , Sameer P. Pendharkar , Scott G. Balster
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Jacqueline J. Garner; Charles A. Brill; Frank D. Cimino
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L29/78 ; H01L29/10 ; H01L27/092 ; H01L21/762 ; H01L29/06 ; H01L21/266

Abstract:
A multi-finger lateral high voltage transistors (MFLHVT) includes a substrate doped a first dopant type, a well doped a second dopant type, and a buried drift layer (BDL) doped first type having a diluted BDL portion (DBDL) including dilution stripes. A semiconductor surface doped the second type is on the BDL. Dielectric isolation regions have gaps defining a first active area in a first gap region (first MOAT) and a second active area in a second gap region (second MOAT). A drain includes drain fingers in the second MOAT interdigitated with source fingers in the first MOAT each doped second type. The DBDL is within a fingertip drift region associated drain fingertips and/or source fingertips between the first and second MOAT. A gate stack is on the semiconductor surface between source and drain. The dilution stripes have stripe widths that increase monotonically with a drift length at their respective positions.
Public/Granted literature
- US20160336427A1 DILUTED DRIFT LAYER WITH VARIABLE STRIPE WIDTHS FOR POWER TRANSISTORS Public/Granted day:2016-11-17
Information query
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