Invention Grant
- Patent Title: Semiconductor device
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Application No.: US14404102Application Date: 2014-02-28
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Publication No.: US09668338B2Publication Date: 2017-05-30
- Inventor: Takashi Uno , Kazuhiro Yahata
- Applicant: Panasonic Intellectual Property Management Co., Ltd.
- Applicant Address: JP Osaka
- Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2013-066885 20130327
- International Application: PCT/JP2014/001105 WO 20140228
- International Announcement: WO2014/155974 WO 20141002
- Main IPC: H05K1/18
- IPC: H05K1/18 ; H05K1/02 ; H01L23/66 ; H05K7/00 ; H01L23/02 ; H01L23/48 ; H01L23/52 ; H01L23/043 ; H01L23/047

Abstract:
A semiconductor device is provided that is inexpensively manufactured with variation in high-frequency characteristics suppressed. Internal matching circuit boards are disposed on at least one signal transmission path of an input-side signal transmission path between an input terminal and a semiconductor element and an output-side signal transmission path between the semiconductor element and an output terminal and is provided for matching at least between output impedance of an external circuit connected to the input terminal and input impedance of the semiconductor device or between input impedance of an external circuit connected to the output terminal and output impedance of the semiconductor device, and components are electrically connected by at least one wire causing a change exceeding an allowable value in high-frequency characteristics of the semiconductor device due to a change in wire length and are disposed in contact with each other inside a package.
Public/Granted literature
- US20150216035A1 SEMICONDUCTOR DEVICE Public/Granted day:2015-07-30
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