Invention Grant
- Patent Title: Semiconductor device
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Application No.: US14515993Application Date: 2014-10-16
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Publication No.: US09673224B2Publication Date: 2017-06-06
- Inventor: Shunpei Yamazaki , Shuhei Nagatsuka , Tatsuya Onuki , Yutaka Shionoiri , Kiyoshi Kato , Hidekazu Miyairi
- Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Fish & Richardson P.C.
- Priority: JP2013-219679 20131022; JP2013-219680 20131022; JP2013-219683 20131022
- Main IPC: H01L27/12
- IPC: H01L27/12 ; H01L29/423 ; H01L29/786

Abstract:
To provide a semiconductor device that is suitable for miniaturization. The semiconductor device includes a first transistor, a second transistor over the first transistor, a barrier layer between the first transistor and the second transistor, a first electrode between the first transistor and the barrier layer, and a second electrode between the hairier layer and the second transistor and overlapping the first electrode with the barrier layer therebetween. A gate electrode of the first transistor, the first electrode, one of a source electrode and a drain electrode of the second transistor are electrically connected to one another. A channel is formed in a first semiconductor layer including a single crystal semiconductor in the first transistor. A channel is formed in a second semiconductor layer including an oxide semiconductor in the second transistor.
Public/Granted literature
- US20150108470A1 SEMICONDUCTOR DEVICE Public/Granted day:2015-04-23
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