- Patent Title: Modified tunneling field effect transistors and fabrication methods
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Application No.: US14156565Application Date: 2014-01-16
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Publication No.: US09673757B2Publication Date: 2017-06-06
- Inventor: Yanxiang Liu , Min-hwa Chi
- Applicant: GLOBALFOUNDRIES Inc.
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES INC.
- Current Assignee: GLOBALFOUNDRIES INC.
- Current Assignee Address: KY Grand Cayman
- Agency: Heslin Rothenberg Farley & Mesiti P.C.
- Main IPC: H01L29/739
- IPC: H01L29/739 ; H03C3/02 ; H01L29/66 ; H01L29/78 ; H03C3/24 ; H01L29/08 ; H01L29/161

Abstract:
Tunneling field effect transistors and fabrication methods thereof are provided, which include: obtaining a gate structure disposed over a substrate structure; and providing a source region and a drain region within the substrate structure separated by a channel region, the channel region underlying, at least partially, the gate structure, and the providing including: modifying the source region to attain a narrowed source region bandgap; and modifying the drain region to attain a narrowed drain region bandgap, the narrowed source region bandgap and the narrowed drain region bandgap facilitating quantum tunneling of charge carriers from the source region or the drain region to the channel region. Devices including digital modulation circuits with one or more tunneling field effect transistor(s) are also provided.
Public/Granted literature
- US20150200298A1 MODIFIED TUNNELING FIELD EFFECT TRANSISTORS AND FABRICATION METHODS Public/Granted day:2015-07-16
Information query
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