- 专利标题: Integrated protection devices with monitoring of electrical characteristics
-
申请号: US13453739申请日: 2012-04-23
-
公开(公告)号: US09679885B2公开(公告)日: 2017-06-13
- 发明人: David Lidsky , Ognjen Djekic , Ion Opris , Budong You , Anthony J. Stratakos , Alexander Ikriannikov , Biljana Beronja , Trey Roessig
- 申请人: David Lidsky , Ognjen Djekic , Ion Opris , Budong You , Anthony J. Stratakos , Alexander Ikriannikov , Biljana Beronja , Trey Roessig
- 申请人地址: US CA Fremont
- 专利权人: Volterra Semiconductor Corporation
- 当前专利权人: Volterra Semiconductor Corporation
- 当前专利权人地址: US CA Fremont
- 代理机构: Weaver Austin Villeneuve & Sampson LLP
- 主分类号: H01H35/00
- IPC分类号: H01H35/00 ; H01L27/02 ; H02H3/087 ; H02H3/18 ; H02H3/20 ; H02H3/42 ; G01R19/165
摘要:
Disclosed are systems, devices, circuits, components, mechanisms, and processes in which a switching mechanism can be coupled between components. The switching mechanism is configured to have an on state or an off state, where the on state allows current to pass along a current path. A monitoring mechanism has one or more sensing inputs coupled to sense an electrical characteristic at the current path. The electrical characteristic can be a current, voltage, and/or power by way of example. The monitoring mechanism is configured to output a reporting signal indicating the sensed electrical characteristic. The monitoring mechanism can be integrated with the switching mechanism on a chip.
公开/授权文献
信息查询